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Volumn 79, Issue 15, 2009, Pages

Structural characterization of pressure-induced amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 66149173674     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.155209     Document Type: Article
Times cited : (34)

References (42)
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    • (1993) MRS Symposia Proceedings , pp. 571
    • Williams, J.S.1    Field, J.S.2    Swain, M.V.3
  • 24
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    • Microcal Origin Version 6.0 (Microcal Software, Northampton, MA
    • Microcal Origin Version 6.0 (Microcal Software, Northampton, MA, 1999).
    • (1999)
  • 28
    • 45449087954 scopus 로고    scopus 로고
    • 10.1016/j.ultramic.2007.11.004
    • W. G. Stratton and P. M. Voyles, Ultramicroscopy 108, 727 (2008). 10.1016/j.ultramic.2007.11.004
    • (2008) Ultramicroscopy , vol.108 , pp. 727
    • Stratton, W.G.1    Voyles, P.M.2
  • 33
    • 23844450658 scopus 로고    scopus 로고
    • Fundamentals of Nanoindentation and Nanotribology III
    • Materials Research Society, Pittsburgh
    • J. S. Williams, B. Haberl, and J. E. Bradby, Fundamentals of Nanoindentation and Nanotribology III, MRS Symposia Proceedings No. 841 (Materials Research Society, Pittsburgh, 2005), p. R10.3.1/T6.3.1.
    • (2005) MRS Symposia Proceedings
    • Williams, J.S.1    Haberl, B.2    Bradby, J.E.3
  • 35
    • 66149189736 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Illinois at Urbana-Champaign
    • P. M. Voyles, Ph.D. thesis, University of Illinois at Urbana-Champaign, 2001.
    • (2001)
    • Voyles, P.M.1
  • 40
    • 36149028506 scopus 로고
    • 10.1088/0034-4885/49/5/001
    • J. S. Williams, Rep. Prog. Phys. 49, 491 (1986). 10.1088/0034-4885/49/5/ 001
    • (1986) Rep. Prog. Phys. , vol.49 , pp. 491
    • Williams, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.