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Volumn 19, Issue 45, 2007, Pages

Real space information from fluctuation electron microscopy: Applications to amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CONSTRAINT THEORY; ELECTRON MICROSCOPY; FINITE ELEMENT METHOD; INFORMATION ANALYSIS; MATHEMATICAL MODELS;

EID: 36049032183     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/45/455202     Document Type: Conference Paper
Times cited : (27)

References (33)
  • 7
    • 24944544628 scopus 로고    scopus 로고
    • Soper A K 2005 Phys. Rev. B 72 104204
    • (2005) Phys. Rev. , vol.72 , Issue.10 , pp. 104204
    • Soper, A.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.