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Volumn 19, Issue 45, 2007, Pages
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Real space information from fluctuation electron microscopy: Applications to amorphous silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
BINDING ENERGY;
CONSTRAINT THEORY;
ELECTRON MICROSCOPY;
FINITE ELEMENT METHOD;
INFORMATION ANALYSIS;
MATHEMATICAL MODELS;
EXPERIMENTALY CONSTRAINED MOLECULAR RELAXATION (ECMR);
FLUCTUATION ELECTRON MICROSCOPY;
INTERATOMIC INTERACTIONS;
AMORPHOUS SILICON;
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EID: 36049032183
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/19/45/455202 Document Type: Conference Paper |
Times cited : (27)
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References (33)
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