|
Volumn 603, Issue 13, 2009, Pages 2057-2061
|
Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
|
Author keywords
Bismuth; Burgers vector; Epitaxial growth; Misfit dislocation
|
Indexed keywords
A-SPOTS;
BI (1 1 1);
BI FILMS;
DISLOCATION NETWORKS;
DISLOCATION PATTERNING;
HETERO EPITAXIES;
HETERO INTERFACES;
INHERENT STRAINS;
LATTICE DISTORTIONS;
LOW-ENERGY ELECTRON DIFFRACTIONS;
MISFIT DISLOCATION;
NANO-SCALE;
ONE-DIMENSIONAL;
REPULSIVE INTERACTIONS;
SI(0 0 1);
SURFACE PROFILES;
BISMUTH;
BURGERS VECTOR;
ELECTRON DIFFRACTION;
EPITAXIAL FILMS;
MOLECULAR BEAM EPITAXY;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON;
EPITAXIAL GROWTH;
|
EID: 65549140676
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2009.03.027 Document Type: Article |
Times cited : (8)
|
References (36)
|