SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 603, Issue 13, 2009, Pages 2047-2056

The backscattering factor for systems with a non-uniform surface region: Definition and calculations

(1) Jablonski, A a

a INSTITUTE OF PHYSICAL CHEMISTRY (Poland)

Author keywords

Auger ejection; Computer simulations; Copper; Electron bombardment; Electron solid interactions; Gold; Silicon; Silver

Indexed keywords

AUGER EJECTION; AUGER TRANSITIONS; BACKSCATTERING FACTORS; BURIED LAYERS; COMPOSITION PROFILES; DEPTH DEPENDENCES; DEPTH PROFILES; DEPTH STRUCTURES; ELECTRON BOMBARDMENT; ELECTRON-SOLID INTERACTIONS; LOWER ENERGIES; MATRIX MATERIALS; NON-UNIFORM; PRIMARY BEAM ENERGIES; SIGNAL INTENSITIES; SPUTTER-DEPTH PROFILING; SPUTTERING TIME; SURFACE REGIONS; THIN LAYERS;

AUGER ELECTRON SPECTROSCOPY; AUGERS; BACKSCATTERING; COMPUTER SIMULATION; DISTRIBUTION FUNCTIONS; ELECTRON PROBE MICROANALYSIS; ELECTRONS; GOLD; SILVER; SPUTTERING; SURFACE STRUCTURE;

DEPTH PROFILING;

EID: 65549108287 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2009.03.024 Document Type: Article

Times cited : (5)

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