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Volumn 91, Issue 15, 2007, Pages

Determination of InN-GaN heterostructure band offsets from internal photoemission measurements

Author keywords

[No Author keywords available]

Indexed keywords

EPILAYERS; HETEROJUNCTIONS; PHOTOCURRENTS; PHOTOELECTRON SPECTROSCOPY; THRESHOLD ELEMENTS;

EID: 35248821083     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2794788     Document Type: Article
Times cited : (21)

References (14)
  • 9
    • 0006898739 scopus 로고
    • edited by R. K.Williardson and A. L.Beer (Academic, New York
    • R. Williams, in Semiconductors and Semimetals, edited by, R. K. Williardson, and, A. L. Beer, (Academic, New York, 1970), Vol. 6, p. 97.
    • (1970) Semiconductors and Semimetals , vol.6 , pp. 97
    • Williams, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.