Indentation of single-crystal silicon nanolines: Buckling and contact friction at nanoscales

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Li, Bin ^a   Zhao, Qiu ^a   Huang, Huai ^a   Luo, Zhiquan ^a   Kang, Min K ^a   Im, Jang Hi ^a   Allen, Richard A ^b   Cresswell, Michael W ^b   Huang, Rui ^a   Ho, Paul S ^a  

^a The University of Texas at Austin   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BUCKLING MODES; CONTACT FRICTIONS; CRITICAL LOADS; FINITE ELEMENT SIMULATIONS; HIGH QUALITIES; INDENTATION LOADS; LARGE DISPLACEMENTS; NANO SCALE; NANO-INDENTATION TESTS; NANOLINES; SINGLE-CRYSTAL SILICONS;

ASPECT RATIO; FRICTION; MECHANICAL PROPERTIES; NANOSTRUCTURED MATERIALS;

BUCKLING;

EID: 65249150693     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3103251     Document Type: Article

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