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Volumn 149, Issue 17-18, 2009, Pages 715-717
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Preparation and rapid thermal annealing of AlN thin films grown by molecular beam epitaxy
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Author keywords
A. AlN; B. Molecular beam epitaxy; B. Rapid thermal annealing
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Indexed keywords
CORUNDUM;
CRYSTAL GROWTH;
FILM PREPARATION;
MOLECULAR BEAM EPITAXY;
MOLECULAR DYNAMICS;
PHOTORESISTS;
RAPID THERMAL ANNEALING;
RAPID THERMAL PROCESSING;
SEMICONDUCTOR QUANTUM WIRES;
SURFACE ROUGHNESS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
A. ALN;
ALN FILMS;
ALN THIN FILMS;
ANNEALING TEMPERATURES;
ATOMIC FORCES;
B. MOLECULAR BEAM EPITAXY;
B. RAPID THERMAL ANNEALING;
BEFORE AND AFTER;
FULL WIDTH AT HALF-MAXIMUM;
INTERLAYER GROWTHS;
ORDER OF MAGNITUDES;
RADIO FREQUENCIES;
ROCKING CURVES;
SAPPHIRE SUBSTRATES;
THREADING DISLOCATIONS;
X- RAY DIFFRACTIONS;
MOLECULAR BEAMS;
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EID: 63149118673
PISSN: 00381098
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssc.2009.02.008 Document Type: Article |
Times cited : (47)
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References (21)
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