Corrigendum to "Electrical transport and structural study of CuCr1 - xMgxO2 delafossite thin films grown by pulsed laser deposition" [Thin Solid Films 517 (2009) 3211-3215] (DOI:10.1016/j.tsf.2008.10.097);Electrical transport and structural study of CuCr1 - xMgxO2 delafossite thin films grown by pulsed laser deposition

Thin Solid Films

Volumn 517, Issue 11, 2009, Pages 3211-3215

  Sadik, P W ^a   Ivill, M ^a   Craciun, V ^a   Norton, D P ^a  

^a University of Florida   (United States)

Author keywords

Atomic force microscopy; CuCrO2; Delafossite; P type; Pulsed laser deposition; Spinel; Transparent conducting oxide; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINARY ALLOYS; CHROMIUM ALLOYS; COPPER ALLOYS; COPPER COMPOUNDS; ENERGY GAP; EPITAXIAL GROWTH; FILM GROWTH; MAGNESIUM ALLOYS; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SEMICONDUCTOR DOPING; THIN FILMS; TRANSPARENCY; TRANSPARENT CONDUCTING OXIDES; X RAY DIFFRACTION;

CUCRO2; DELAFOSSITES; ELECTRICAL TRANSPORT; OPTICAL TRANSPARENCY; P-TYPE; SPINEL; TRANSPARENT DEVICES; WIDE BAND-GAP MATERIAL;

OPTICAL FILMS;

EID: 62849127377     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.10.128     Document Type: Erratum

References (46)

1. Norton D.P. Mater. Sci. Eng. R 43 (2004) 39
2. Ozgur U., Alivov Y.I., Liu C., Teke A., Reshchikov M.A., Dogan S., Avrutin V., Cho S.J., and Morkoc H. J. Appl. Phys. 98 (2005) 041301
3. Granqvist C.G., and Hultaker A. Thin Solid Films 411 (2002) 1
4. Ginley D.S., and Bright C. Mater. Res. Bull. 25 (2000) 8
5. Ohta H., Nomura K., Hiramatsu H., Ueda K., Kamiya T., Hirano M., and Hosono H. Solid-State Electron. 47 (2003) 12
6. Yanagi H., Hase T., Ibuki S., Ueda K., and Hosono H. Appl. Phys. Lett. 78 (2001) 1583
7. Marquardt M.A., Ashmore N.A., and Cann D.P. Crystal Chemistry and Electrical Properties of the Delafossite Structure (2006), Elsevier, Amsterdam, Netherlands 146
8. Kawazoe H., Yasukawa M., Kyodo H., Kurita M., Yanagi H., and Hosono H. Nature (London) 389 (1997) 6654
9. Duan N., Sleight A.W., Jayaraj M.K., and Tate J. Appl. Phys. Lett. 77 (2000) 9
10. Yanagi H., Kawazoe H., Kudo A., Yasukawa M., and Hosono H. J. Electrocer. 4 (2000) 407
11. Koyanagi T., Harima H., Yanase A., and Katayama-Yoshida H. J. Phys. Chem. Solids 64 (2003) 1443
12. Wang Y., Gong H., and Liu L. Int. J. Mod. Phys. B 16 (2002) 308
13. Ingram B.J., Mason T.O., Asahi R., Park K.T., and Freeman A.J. Phys. Rev. B 64 (2001) 155114
14. Robertson J., Peacock P.W., Towler M.D., and Needs R. Thin Solid Films 411 (2002) 96
15. Buljan A., Alemany P., and Ruiz E. J. Phys. Chem. B 103 (1999) 8060
16. Benko F.A., and Koffyberg F.P. Phys. Status Solidi A 94 (1986) 231
17. Boudin S., Felser C., and Studer F. Solid State Sci. 5 (2003) 741
18. Nie X., Wei S.-H., and Zhang S.B. Phys. Rev. Lett. 88 (2002) 066405
19. Dloczik L., Tomm Y., Konenkamp R., Lux-Steiner M.C., and Dittrich Th. Thin Solid Films 451/452 (2004) 116
20. Banerjee A.N., Maity R., and Chattopadhyay K.K. Mater. Lett. 58 (2004) 10
21. Tsuboi N., Takahashi Y., Kobayashi S., Shimizu H., Kato K., and Kaneko F. J. Phys. Chem. Solids 64 (2003) 1671
22. Ohashi M., Iida Y., and Morikawa H. J. Am. Ceram. Soc. 85 (2002) 270
23. Stauber R.E., Perkins J.D., Parilla P.A., and Ginley D.S. Electrochem. Solid-State Lett. 2 (1999) 654
24. Pearton S.J., Norton D.P., Ip K., Heo Y.W., and Steiner T. Superlattices and Microstruct. 34 (2003) 3
25. Fortunato E., Ginley D., Hosono H., and Paine D.C. Mater. Res. Bull. 32 (2007) 242
26. Kudo A., Yanagi H., Hosono H., and Kawazoe H. Appl. Phys. Lett. 73 (1998) 220
27. Heo Y.W., Kwon Y.W., Li Y., Pearton S.J., and Norton D.P. Appl. Phys. Lett. 84 (2004) 3474
28. Kim H.S., Pearton S.J., Norton D.P., and Ren F. J. Appl. Phys. 102 (2007) 104904
29. Yabuta H., Sano M., Abe K., Aiba T., Den T., Kumomi H., Nomura K., Kamiya T., and Hosono H. Appl. Phys. Lett. 89 (2006) 112123
30. Kwon Y., Li Y., Heo Y.W., Jones M., Holloway P.H., Norton D.P., Park Z.V., and Li S. Appl. Phys. Lett. 84 (2004) 2685
31. Ohta H., Kawamura K., Orita M., Hirano M., Sarukura N., and Hosono H. Appl. Phys. Lett. 77 (2000) 475
32. Ip K., Heo Y.W., Norton D.P., Pearton S.J., LaRoche J.R., and Ren F. Appl. Phys. Lett. 85 (2004) 1169
33. Saadi S., Bouguelia A., and Trari M. Sol. Energy 80 (2006) 272
34. Varadarajan V., and Norton D.P. Appl. Phys. A: Mater. Sci. Process. 85 (2006) 117
35. Nagarajan R., Draeseke A.D., Sleight A.W., and Tate J. J. Appl. Phys. 89 (2001) 8022
36. Tate J., Jayaraj M.K., Draeseke A.D., Ulbrich T., Sleight A.W., Vanaja K.A., Nagarajan R., Wager J.F., and Hoffman R.L. Thin Solid Films 411 (2002) 119
37. Li D., Fang X.D., Deng Z.H., Zhou S., Tao R.H., Dong W.W., Wang T., Zhao Y.P., Meng G., and Zhu X.B. J. Phys. D: Appl. Phys. 40 (2007) 4910
38. Okuda T., Onoe T., Beppu Y., Terada N., Doi T., Miyasaka S., and Tokura Y. J. Magn. Magn. Mater. 310 (2007) 890
39. Tonooka K., and Kikuchi N. Thin Solid Films 515 (2006) 2415
40. Mahapatra S., and Shivashankar S.A. Chem. Vapor Depos. 9 (2003) 238
41. Nagarajan R., Duan N., Jayaraj M.K., Li J., Vanaja K.A., Yokochi A., Draeseke A., Tate J., and Sleight A.W. Int. J. Inorg. Mater. 3 (2001) 3
42. Barin I., and Sauert F. Thermochemical Data of Pure Substances (1989), VHC, New York, New York
43. Kakehi Y., Satoh K., Yotsuya T., Nakao S., Yoshimura T., Ashida A., and Fujimura N. J. Appl. Phys. 97 (2005) 8
44. Ueda K., Hase T., Yanagi H., Kawazoe H., Hosono H., Ohta H., Orita M., and Hirano M. J. Appl. Phys. 89 (2001) 1790
45. Lim W.T., Stafford L., Sadik P.W., Norton D.P., Pearton S.J., Wang Y.L., and Ren F. Appl. Phys. Lett. 90 (2007) 142101
46. Lim W.T., Sadik P.W., Norton D.P., Pearton S.J., Wang Y.L., and Ren F. Electrochem. Solid State Lett. 10 (2007) H178