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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 15, 2001, Pages 1551141-1551147

Electronic structure and small polaron hole transport of copper aluminate

(5) Ingram, B J a Mason, T O a Asahi, R b Park, K T c Freeman, A J c

a Northwestern University (United States)

b Rd Management Section (Japan)

c NORTHWESTERN UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM DERIVATIVE; COPPER DERIVATIVE;

ANALYTIC METHOD; ARTICLE; ELECTRIC CONDUCTIVITY; HIGH TEMPERATURE; MEASUREMENT; STRUCTURE ANALYSIS; TEMPERATURE DEPENDENCE;

EID: 0035887413 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.64.155114 Document Type: Article

Times cited : (146)

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