Imaging subsurface damage of grinded fused silica optics by confocal fluorescence microscopy

Optics Express

Volumn 17, Issue 5, 2009, Pages 3543-3554

  Neauport, J ^a   Cormont, P ^a   Legros, P ^b   Ambard, C ^c   Destribats, J ^a  

^a CEA CESTA   (France)

^b INSTITUT FRANÇOIS MAGENDIE   (France)

^c DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COOLANTS; FLUORESCENCE; FLUORESCENCE MICROSCOPY; GRINDING (MACHINING); LASER DAMAGE; SILICA;

CONFOCAL FLUORESCENCE MICROSCOPY; DIAMOND GRINDING; EXPERIMENTAL INVESTIGATIONS; FIXED ABRASIVES; FLUORESCENCE CONFOCAL MICROSCOPY; FLUORESCENCE SPECTRUM; FUSED SILICA OPTICS; SUB-SURFACE DAMAGE;

FUSED SILICA;

EID: 61549124112     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.003543     Document Type: Article

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