Polishing-induced contamination of fused silica optics and laser induced damage density at 351 nm

Optics Express

Volumn 13, Issue 25, 2005, Pages 10163-10171

  Neauport, J ^a   Lamaignere, L ^a   Bercegol, H ^a   Pilon, F ^b   Birolleau, J C ^b  

^a CEA CESTA   (France)

^b CEA LE RIPAULT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LASERS; MEASUREMENTS; OPTICAL PROPERTIES; POLISHING;

DAMAGE DENSITY; FUSED SILICA OPTICS; RASTER SCAN METROLOGY;

SILICA;

EID: 28944453518     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.010163     Document Type: Article

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