Properties of modified silica detected within laser-induced damage sites

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4102, Issue , 2000, Pages 106-111

  Kozlowski, Mark R ^a   Demos, Stavros G ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; EMISSION SPECTROSCOPY; LASER DAMAGE; LASER PULSES; OPTICAL MATERIALS; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SILICON;

OXYGEN DEFICIENCY CENTERS (ODC);

SILICA;

EID: 0034514332     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.405274     Document Type: Conference Paper

References (14)