Subsurface damage in some single crystalline optical materials

Applied Optics

Volumn 44, Issue 12, 2005, Pages 2241-2249

  Randi, Joseph A ^a,b   Lambropoulos, John C ^a,c   Jacobs, Stephen D ^a,c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b Center for Optics Manufacturing   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRYSTALLINE MATERIALS; INTERFEROMETRY; NONDESTRUCTIVE EXAMINATION; RAMAN SCATTERING; SINGLE CRYSTALS; SURFACE ROUGHNESS;

GROUND CERAMIC SURFACES; SUBSURFACE DAMAGE (SSD); SURFACE DUCTILE LAYERS; WHITE-LIGHT INTEROFEROMETRY;

OPTICAL MATERIALS;

EID: 17644364740     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.002241     Document Type: Article

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