Correlations between embedded single gold nanoparticles in SiO 2 thin film and nanoscale crater formation induced by pulsed-laser radiation

Journal of Applied Physics

Volumn 92, Issue 10, 2002, Pages 5720-5728

  Papernov, S ^a   Schmid, A W ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION PROCESS; AVERAGE VALUES; CRATER FORMATION; DAMAGE MECHANISM; DAMAGE MORPHOLOGY; DAMAGE THRESHOLD; GOLD NANOPARTICLES; INHOMOGENEITIES; LASER ENERGY ABSORPTION; LASER FLUENCES; LOCALIZED MELTING; MONOLAYER FILM; NANO SCALE; NANOSCALE DEFECTS; SINGLE DEFECT; SURROUNDING MATRIX; THRESHOLD REDUCTION;

ATOMIC FORCE MICROSCOPY; DAMAGE DETECTION; DEFECTS; ENERGY ABSORPTION; METAL NANOPARTICLES; NANOTECHNOLOGY; VAPORS;

PULSED LASERS;

EID: 0037112989     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1512691     Document Type: Article

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