Concerning the impact of polishing induced contamination of fused silica optics on the laser-induced damage density at 351 nm

Optics Communications

Volumn 281, Issue 14, 2008, Pages 3802-3805

  Neauport, J ^a   Cormont, P ^a   Lamaignere L ^a   Ambard, C ^b   Pilon, F ^b   Bercegol, H ^a  

^a CEA CESTA   (France)

^b CEA LE RIPAULT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM; CONTAMINATION; CORRELATION METHODS; IMPURITIES; LASER DAMAGE; OPTICS; POLISHING;

DAMAGE DENSITY; FUSED SILICA OPTICS;

FUSED SILICA;

EID: 44449118329     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2008.03.031     Document Type: Article

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