The relative precision of crystal orientations measured from electron backscattering patterns

Journal of Microscopy

Volumn 181, Issue 1, 1996, Pages 72-81

  Krieger Lassen, N C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Backscatter Kikuchi dffraction; BKD; Crystallographic orientation; EBSP; Electron backscattering patterns; Electron diffraction; Precision; Rotation; Statistics; Uncertainty

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; UNCERTAINTY ANALYSIS;

AUTOMATIC ANALYSIS; BACKSCATTER KIKUCHI DFFRACTION; BKD; CRYSTALLOGRAPHIC ORIENTATIONS; EBSP; ELECTRON BACKSCATTERING PATTERNS; LOCALISED; ORIENTATION DATA; PRECISION; UNCERTAINTY;

CRYSTAL ORIENTATION;

ARTICLE; ELECTRON DIFFRACTION; PRIORITY JOURNAL;

EID: 0030031516     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.95376.x     Document Type: Article

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