Electric field and tip geometry effects on dielectrophoretic growth of carbon nanotube nanofibrils on scanning probes

Nanotechnology

Volumn 19, Issue 45, 2008, Pages

  Wei, Haoyan ^a,b   Craig, Anna ^a   Huey, Bryan D ^a   Papadimitrakopoulos, Fotios ^a   Marcus, Harris L ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BROWNIAN MOVEMENT; CARBON NANOTUBES; DIELECTRIC DEVICES; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; ELECTROPHORESIS; NANOCOMPOSITES; NANOTUBES; PROBES; SCANNING; STABILITY CRITERIA; WETTING;

APPLIED ELECTRIC FIELDS; ATOMIC FORCE MICROSCOPES; BROWNIAN MOTIONS; CAPILLARY FORCES; CONE ANGLES; DEP FORCES; DIELECTROPHORESIS; DRAWING PROCESSES; FORCE CONSTANTS; IN-SITU; LOW QUALITIES; NANO FIBRILS; PROBE APICES; PROBE GEOMETRIES; SCANNING PROBES; SCANNING TUNNELLING MICROSCOPES; SINGLE-WALL CARBON NANOTUBES; SWNT SUSPENSIONS; TIP GEOMETRIES; WETTING ANGLES; WETTING BEHAVIOURS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBE; NANOFIBER; SINGLE WALLED NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTROPHORESIS; GEOMETRY; MECHANICAL PROBE; MOTION; NANOTECHNOLOGY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; WETTABILITY;

EID: 58149268008     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/45/455303     Document Type: Article

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