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note
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In a recent XRD study almost upright molecular arrangement was shown for the PEN monolayer and in a different work it has been reported that PEN exhibits a thickness driven orthorhombic to triclinic phase transition on amorphous carbon coated mica substrates (Ref.). The unit cells proposed in both studies are equal within the error margin, hence we may speculate that the vibrations found in our FT-IR investigation can be assigned to this specific polymorph. Another explanation can be the bimodal growth behavior of PEN films in thin film and bulk phase, which was recently shown to be undetectable by XRD at low nominal film thickness (Ref.). Therefore the shifted vibration of the ultrathin film could dominantly stem from the thin film phase, whereas the thick PEN film shows a superposition of thin film and bulk phase features. Admittedly, this cannot be decided from our data and more work concerning this question in particular and the correlation of FT-IR to XRD in general is necessary and will be subject to our further research efforts.
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