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Volumn 104, Issue 11, 2008, Pages

Structural and electronic properties of pentacene-fullerene heterojunctions

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BINDING ENERGY; CHARGE TRANSFER; CONDUCTING POLYMERS; CONDUCTIVE FILMS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; FILM GROWTH; FOURIER TRANSFORMS; FULLERENES; HETEROJUNCTIONS; INFRARED SPECTROSCOPY; ION EXCHANGE; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; ORGANIC CONDUCTORS; PHASE SEPARATION; PHOTOELECTRON SPECTROSCOPY; POLYMER FILMS; POLYMERS; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR GROWTH; SOLAR CELLS; SOLAR ENERGY; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 58149267455     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040003     Document Type: Article
Times cited : (99)

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    • note
    • In a recent XRD study almost upright molecular arrangement was shown for the PEN monolayer and in a different work it has been reported that PEN exhibits a thickness driven orthorhombic to triclinic phase transition on amorphous carbon coated mica substrates (Ref.). The unit cells proposed in both studies are equal within the error margin, hence we may speculate that the vibrations found in our FT-IR investigation can be assigned to this specific polymorph. Another explanation can be the bimodal growth behavior of PEN films in thin film and bulk phase, which was recently shown to be undetectable by XRD at low nominal film thickness (Ref.). Therefore the shifted vibration of the ultrathin film could dominantly stem from the thin film phase, whereas the thick PEN film shows a superposition of thin film and bulk phase features. Admittedly, this cannot be decided from our data and more work concerning this question in particular and the correlation of FT-IR to XRD in general is necessary and will be subject to our further research efforts.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.