Energy level alignment and morphology of interfaces between molecular and polymeric organic semiconductors

Organic Electronics

Volumn 8, Issue 5, 2007, Pages 606-614

  Zhang, F J ^a,b   Vollmer, A ^c   Zhang, J ^b   Xu, Z ^a   Rabe, J P ^b   Koch, N ^b  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b HUMBOLDT UNIVERSITY   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

Atomic force microscopy; Interfaces; Organic semiconductors; Photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONFORMATIONS; INTERFACES (MATERIALS); OPTOELECTRONIC DEVICES; ORGANIC POLYMERS; PHOTOELECTRON SPECTROSCOPY;

ENERGY LEVEL ALIGNMENT; MATERIAL-DEPENDENT DIPOLES; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 34548828813     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2007.04.010     Document Type: Article

References (24)

1. Tang C.W., and van Slyke S.A. Appl. Phys. Lett. 51 (1987) 913
2. Pope M., and Swenberg C.E. Electronic Processes in Organic Crystals and Polymers (1999), Oxford University Press, Oxford
3. Friend R.H., Gymer R.W., Holmes A.B., Burroughes J.H., Marks R.N., Taliani C., Bradley D.D.C., Dos Santos D.A., Bredas J.L., Löglund M., and Salaneck W.R. Nature 397 (1999) 121
4. In: Hadziioannou G., and van Hutten P.F. (Eds). Semiconducting Polymers (2000), Wiley-VCH, Weinheim
5. Mazhari B. Org. Electron. 6 (2005) 229
6. Ishii H., Sugiyama K., Ito E., and Seki K. Adv. Mater. 11 (1999) 605
7. In: Salaneck W.R., Seki K., Kahn A., and Pireaux J.-J. (Eds). Conjugated Polymer and Molecular Interfaces: Science and Technology for Photonic and Optoelectronic Applications (2001), Marcel Dekker, New York
8. Kahn A., Koch N., and Gao W.Y. J. Polym. Sci. B 41 (2003) 2529
9. Rajagopal A., Wu C.I., and Kahn A. J. Appl. Phys. 83 (1998) 2649
10. Berleb S., Brütting W., and Paasch G. Synth. Met. 122 (2001) 37
11. Gao W.Y., and Kahn A. Appl. Phys. Lett. 82 (2003) 4815
12. Veenstra S.C., and Jonkman H.T. J. Polym. Sci. B 41 (2003) 2549
13. Vazquez H., Gao W., Flores F., and Kahn A. Phys. Rev. B 71 (2005) 041306
14. Molodtsova O.V., Schwieger T., and Knupfer M. Appl. Surf. Sci. 252 (2005) 143
15. Koch N., Salzmann I., Johnson R.L., Pflaum J., Friedlein R., and Rabe J.P. Org. Electron. 7 (2006) 537
16. Rajagopal A., Koch N., Ghijsen J., Kaeriyama K., Johnson R.L., Leising G., and Pireaux J.-J. Metallized Plastics 7 (2001) 1
17. Chao S., Lee K., Yuan J., Wang G.M., Moses D., and Heeger A.J. J. Appl. Phys. 100 (2006) 114503
18. Zen A., Saphiannikova M., Neher D., Grenzer J., Grigorian S., Pietsch U., Asawapirom U., Janietz S., Scherf U., Lieberwirth I., and Wegner G. Macromolecules 39 (2006) 2162
19. Tengstedt C., Osikowicz W., Salaneck W.R., Parker I.D., Hsu C.H., and Fahlman M. Appl. Phys. Lett. 88 (2006) 053502
20. Rentenberger S., Vollmer A., Zojer E., Schennach R., and Koch N. J. Appl. Phys. 100 (2006) 053701
21. Koch N., and Vollmer A. Appl. Phys. Lett. 89 (2006) 162107
22. Koch N., Elschner A., Rabe J.P., and Johnson R.L. Adv. Mater. 17 (2005) 330
23. Hasegawa S., Miyamae T., Yakushi K., Inokuchi H., Seki K., and Ueno N. J. Electron Spectrosc. Relat. Phenom. 88-91 (1998) 891
24. Fukagawa H., Yamane H., Kataoka T., Kera S., Nakamura M., Kudo K., and Ueno N. Phys. Rev. B 73 (2006) 245310