Soft X-ray absorption, UV photoemission, and VUV absorption spectroscopic studies of fluorinated fullerenes

Journal of Electron Spectroscopy and Related Phenomena

Volumn 78, Issue , 1996, Pages 453-456

  Mitsumoto, R ^a   Seki, K ^a   Araki, T ^a   Ito, E ^a   Ouchi, Y ^a   Achiba, Y ^b   Kikuchi, K ^b   Yajima, S ^c   Kawasaki, S ^c   Okino, F ^c   Touhara, H ^c   Kurosaki, H ^d   Sonoda, T ^d   Kobayashi, H ^d  

^a NAGOYA UNIVERSITY   (Japan)

^b TOKYO METROPOLITAN UNIVERSITY   (Japan)

^c SHINSHU UNIVERSITY   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; FULLERENES; PHOTOELECTRON SPECTROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY SPECTROSCOPY;

FLUORINATED FULLERENES; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; SOFT X RAY ABSORPTION SPECTROSCOPY; UV PHOTOEMISSION SPECTROSCOPY; VUV ABSORPTION SPECTROSCOPY;

ELECTRON SPECTROSCOPY;

EID: 0030142539     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(96)80121-6     Document Type: Article

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