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Volumn 109, Issue 2, 2009, Pages 177-188

Medium-range order in molecular materials: Fluctuation electron microscopy for detecting fullerenes in disordered carbons

Author keywords

C60; Fluctuation microscopy; Fullerenes; Medium range order; Shungite

Indexed keywords

AROMATIC HYDROCARBONS; FINITE ELEMENT METHOD; FULLERENES;

EID: 57749187633     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.10.006     Document Type: Article
Times cited : (17)

References (54)
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    • (1959) X-ray Diffraction
    • Warren, B.E.1
  • 4
    • 0002211266 scopus 로고    scopus 로고
    • Real-space rietveld: full profile structural refinement of the atomic pair distribution function
    • Billinge S.J.L., and Thorpe M.F. (Eds), Plenum Press, New York
    • Billinge S.J.L. Real-space rietveld: full profile structural refinement of the atomic pair distribution function. In: Billinge S.J.L., and Thorpe M.F. (Eds). Local Structure from Diffraction (1998), Plenum Press, New York 137
    • (1998) Local Structure from Diffraction , pp. 137
    • Billinge, S.J.L.1
  • 48
    • 57749209021 scopus 로고    scopus 로고
    • M. Yoshida, Fullerene Structure Library, 〈http://www.cochem2.tutkie.tut.ac.jp/Fuller/higher/higherE.html〉 (1997).
    • M. Yoshida, Fullerene Structure Library, 〈http://www.cochem2.tutkie.tut.ac.jp/Fuller/higher/higherE.html〉 (1997).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.