Diffraction microscopy for disordered tetrahedral networks

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7779-7784

  Cheng, Ju Yin ^a   Treacy, M M J ^b   Keblinski, P J ^a   Gibson, J M ^c  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION MICROSCOPY; DIFFUSE REFLECTANCE; SMALL ANGLE DIFFRACTION; TETRAHEDRAL NETWORKS;

AMORPHOUS MATERIALS; CRYSTAL STRUCTURE; DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IRRADIATION; NEUTRON DIFFRACTION; REFRACTIVE INDEX; SEMICONDUCTING GERMANIUM; SILICA; SINGLE CRYSTALS; X RAY DIFFRACTION;

SEMICONDUCTING SILICON;

EID: 3142643612     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1711174     Document Type: Article

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