Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction

Ultramicroscopy

Volumn 104, Issue 3-4, 2005, Pages 206-219

  Jungk, T ^a   Walther, T ^a,b   Mader, W ^a  

^a UNIVERSITY OF BONN   (Germany)

^b CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

Author keywords

Electron diffraction; Fluctuation electron microscopy; Medium range order; Speckle pattern

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL ANALYSIS; ELECTRON DIFFRACTION; GERMANIUM; GOLD; POLYCRYSTALLINE MATERIALS; SPECKLE; STATISTICAL METHODS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

FLUCTUATION ELECTRON MICROSCOPY (FEM); FREQUENCY SELECTIVE ANALYSIS; SPECKLE STATISTICS; STRUCTURAL FLUCTUATIONS;

ELECTRON MICROSCOPY;

CRYSTALLIN; GERMANIUM; GOLD;

ANALYTIC METHOD; ARTICLE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FUNCTIONAL ASSESSMENT; IMAGE ANALYSIS; MEASUREMENT; QUANTITATIVE ANALYSIS; STATISTICAL ANALYSIS; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; VARIANCE;

EID: 22144431887     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.04.003     Document Type: Article

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