Insights into near-frictionless carbon films

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 7765-7771

  Johnson, Jacqueline A ^a   Woodford, John B ^a   Chen, Xidong ^a,b   Andersson, Joakim ^c   Erdemir, Ali ^a   Fenske, George R ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b CEDARVILLE UNIVERSITY   (United States)

^c UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FLUCTUATION MICROSCOPY; HYDROGEN FORWARD SCATTERING SPECTROSCOPY (HFS); NEAR FRICTIONLESS CARBON (NFC) FILMS; ULTRAVIOLET RAMAN SPECTROSCOPY; X RAY ABSORPTION FINE STRUCTURES;

AMORPHOUS FILMS; CHEMICAL BONDS; ELECTRIC CONDUCTIVITY; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FRICTION; HYDROGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; TRANSPARENCY;

DIAMOND FILMS;

EID: 3142647779     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1739287     Document Type: Article

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