The influence of substrate and annealing temperatures on electrical properties of p-type ZnO films

Physica B: Condensed Matter

Volumn 404, Issue 1, 2009, Pages 138-142

  Zhang, C Y ^a  

^a SHANGHAI INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Electrical properties; TG DSC MS measurements; ZnO films

Indexed keywords

ANNEALING; DIFFERENTIAL SCANNING CALORIMETRY; DIGITAL CAMERAS; ELECTRIC PROPERTIES; LASER INTERFEROMETRY; MASS SPECTROMETRY; SEMICONDUCTING ZINC COMPOUNDS; SPRAY PYROLYSIS; SUBSTRATES; ULTRASONIC APPLICATIONS; ULTRASONIC TESTING; ZINC OXIDE;

ANNEALING TEMPERATURES; CODOPING TECHNIQUES; DOPING PROCESSES; ELECTRICAL PROPERTIES; MASS SPECTRUMS; SUBSTRATE TEMPERATURES; TG-DSC-MS MEASUREMENTS; THERMOGRAVIMETRY; ULTRASONIC SPRAY PYROLYSISES; ZNO FILMS;

METALLIC FILMS;

EID: 57649227379     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2008.10.034     Document Type: Article

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