SCOPUS 정보 검색 플랫폼

Volumn 132, Issue 2, 2004, Pages 75-78

Structural and electrical properties of nitrogen and aluminum codoped p-type ZnO films

Author keywords

A. Semiconductors; A. ZnO thin films; B. Ultrasonic spray pyrolysis; C. N and Al codoping

Indexed keywords

N AND AL CODOPING; ULTRASONIC SPRAY PYROLYSIS; ZNO THIN FILMS;

DOPING (ADDITIVES); MAGNETRON SPUTTERING; NITROGEN; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; THICK FILMS; X RAY DIFFRACTION;

ZINC OXIDE;

EID: 4344683633 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2004.07.033 Document Type: Article

Times cited : (39)

References (15)

1
- 0001649349
- Y.R. Ryu, S. Zhu, I.D. Budai, H.R. Chandrasekhar, P.F. Miceli, H.W. White, J. Appl. Phys. 88 (2000) 201.
- (2000) J. Appl. Phys. , vol.88 , pp. 201
- Ryu, Y.R.¹ Zhu, S.² Budai, I.D.³ Chandrasekhar, H.R.⁴ Miceli, P.F.⁵ White, H.W.⁶

2
- 2542422532
- D.M. Bagnall, Y.F. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, T. Goto, Appl. Phys. Lett. 70 (1997) 2230.
- (1997) Appl. Phys. Lett. , vol.70 , pp. 2230
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, Z.³ Yao, T.⁴ Koyama, S.⁵ Shen, M.Y.⁶ Goto, T.⁷

3
- 0142109458
- Z.K. Tang, G.K.L. Wong, P. Yu, M. Kawasaki, A. Ohtomo, H. Koinuma, Y. Segawa, Appl. Phys. Lett. 72 (1998) 3270.
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3270
- Tang, Z.K.¹ Wong, G.K.L.² Yu, P.³ Kawasaki, M.⁴ Ohtomo, A.⁵ Koinuma, H.⁶ Segawa, Y.⁷

4
- 0036136718
- P. Nunes, E. Fortunato, P. Tonello, F. Braz Fernandes, P. Vilarinho, R. Martins, Vacuum 64 (2002) 281.
- (2002) Vacuum , vol.64 , pp. 281
- Nunes, P.¹ Fortunato, E.² Tonello, P.³ Braz Fernandes, F.⁴ Vilarinho, P.⁵ Martins, R.⁶

5
- 0031547484
- Y. Morinaga, K. Sakuragi, N. Fujimura, T. Ito, J. Cryst. Growth 174 (1997) 691.
- (1997) J. Cryst. Growth , vol.174 , pp. 691
- Morinaga, Y.¹ Sakuragi, K.² Fujimura, N.³ Ito, T.⁴

6
- 0000900190
- S. Choopun, R.D. Vispute, W. Noch, A. Balsamo, R.P. Sharma, T. Venkatesan, A. Iliadis, D.C. Look, Appl. Phys. Lett. 75 (1999) 3947.
- (1999) Appl. Phys. Lett. , vol.75 , pp. 3947
- Choopun, S.¹ Vispute, R.D.² Noch, W.³ Balsamo, A.⁴ Sharma, R.P.⁵ Venkatesan, T.⁶ Iliadis, A.⁷ Look, D.C.⁸

7
- 0001026156
- T. Aoki, Y. Hatanaka, D.C. Look, Appl. Phys. Lett. 76 (2000) 3257.
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3257
- Aoki, T.¹ Hatanaka, Y.² Look, D.C.³

8
- 1242285028
- J.M. Bian, X.M. Li, X.D. Gao, W.D. Yu, L.D. Chen, Appl. Phys. Lett. 84 (2004) 541.
- (2004) Appl. Phys. Lett. , vol.84 , pp. 541
- Bian, J.M.¹ Li, X.M.² Gao, X.D.³ Yu, W.D.⁴ Chen, L.D.⁵

9
- 0037465329
- M. Sanmyo, Y. Tomita, K. Kobayashi, Chem. Mater. 15 (2003) 819.
- (2003) Chem. Mater. , vol.15 , pp. 819
- Sanmyo, M.¹ Tomita, Y.² Kobayashi, K.³

10
- 0037104275
- C-H. Park, S.B. Zhang, S.-H. Wei, Phys. Rev. B 66 (2002) 73202.
- (2002) Phys. Rev. B , vol.66 , pp. 73202
- Park, C.-H.¹ Zhang, S.B.² Wei, S.-H.³

11
- 0043269843
- L.G. Wang, Alex Zunger, Phys. Rev. Lett. 90 (2003) 256401.
- (2003) Phys. Rev. Lett. , vol.90 , pp. 256401
- Wang, L.G.¹ Zunger, A.²

12
- 0034972148
- T. Yamamoto, H. Katayama-Yoshida, Physica B 302/303 (2001) 155.
- (2001) Physica B , vol.302-303 , pp. 155
- Yamamoto, T.¹ Katayama-Yoshida, H.²

13
- 0037012268
- X.L. Guo, H. Tabata, T. Kawai, Opt. Mater. 19 (2002) 229.
- (2002) Opt. Mater. , vol.19 , pp. 229
- Guo, X.L.¹ Tabata, H.² Kawai, T.³

14
- 0037671310
- T. Ohshima, T. Ikegami, K. Ebihara, J. Asmussen, R. Thareja, Thin Solid Films 435 (2003) 49.
- (2003) Thin Solid Films , vol.435 , pp. 49
- Ohshima, T.¹ Ikegami, T.² Ebihara, K.³ Asmussen, J.⁴ Thareja, R.⁵

15
- 0035881395
- L.D. Chen, T. Kawahara, X.F. Tang, T. Goto, T. Hirai, J.S. Dyck, W. Chen, C. Uher, J. Appl. Phys. 90 (2001) 1864.
- (2001) J. Appl. Phys. , vol.90 , pp. 1864
- Chen, L.D.¹ Kawahara, T.² Tang, X.F.³ Goto, T.⁴ Hirai, T.⁵ Dyck, J.S.⁶ Chen, W.⁷ Uher, C.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.