Growth, structure and optical characterization of high quality ZnO thin films obtained by spray pyrolysis

Thin Solid Films

Volumn 350, Issue 1, 1999, Pages 192-202

  Paraguay D , F ^a   Estrada L , W ^a   Acosta N , D R ^b   Andrade, E ^b   Miki Yoshida, M ^c  

^a UNIVERSIDAD NACIONAL DE INGENIERÍA   (Peru)

^b UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^c CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL MICROSTRUCTURE; ENERGY GAP; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; ZINC OXIDE;

SPRAY PYROLYSIS;

THIN FILMS;

EID: 0032663894     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00050-4     Document Type: Article

References (38)

1. Ambia M.G., Islam M.N., Obaidul M. Hakim. J. Mater. Sci. 27:1992;5169.
2. Roth A.P., Williams D.F. J. Appl. Phys. 52:1981;6685.
3. Major S., Kumar S., Bhatnagar M., Chopra K.L. Appl. Phys. Lett. 49:1986;394.
4. Jin Z.C., Hamberg I., Granqvist C.G. J. Appl. Phys. 64:1988;5117.
5. Craciun V., et al. Phys. Lett. 65:(23):1994;2963.
6. Ghandi S.K., Field R.J., Shelly J.R. Appl. Phys. Lett. 37:1980;449.
7. Aktaruzzaman A.F., Sharma G.L., Malhotra L.K. Thin Solid Films. 198:1991;67.
8. Olvera M. de la L., et al. Thin Solid Films. 229:1993;196.
9. Siefert W. Thin Solid Films. 121:1984;267.
10. Blandenet G., Court M., Lagarde Y. Thin Solid Films. 77:1981;81.
11. Viverito T.R., Rilee E.W., Slack L.H. Am. Ceram. Soc. Bull. 54:1975;217.
12. Miki-Yoshida M., Andrade E. Thin Solid Films. 224:1993;87.
13. Gómez H., et al. Thin Solid Films. 293:1997;117.
14. Messaoudi C., Sayah D., Abd-Lefdil M. Phys. Stat. Solidi A. 151:1995;93.
15. Kobayashi K., et al. Thin Solid Films. 266:1995;106.
16. Deschanvres J.L., Bochu B., Joubert J.C. J. Phys. III France. 4:1994;1243.
17. Hu J., Gordon R.G. J. Appl. Phys. 71:(2):1992;880.
18. van Heerden J.L., Swanepoel R. Thin Solid Films. 299:1997;72.
19. Mar G.L., Timbrell P.Y., Lamb R.N. Chem. Mater. 1995;7.
20. Caillaud F., Smith A., Baumard J.F. J. Am. Ceram. Soc. 76:(4):1993;998.
21. O.F.Z. Khan, P. O'Brien, Thin Solid Films 173 (1989) 95. A.K. Gyani, O.F.Z. Khan, P. O'Brien, D.S. Urch, Thin Solid Films 182 (1989) L1.
22. O.F.Z. Khan, P. O'Brien, Thin Solid Films 173 (1989) 95. A.K. Gyani, O.F.Z. Khan, P. O'Brien, D.S. Urch, Thin Solid Films 182 (1989) L1.
23. Sanz Maudez J., Rodriguez T. Thin Solid Films. 69:1980;183.
24. Caillaud F., Smith A., Baumard J.F. Thin Solid Films. 208:1992;4.
25. Vasu V., Subrahmanyam S. Thin Solid Films. 189:1990;217.
26. Dirksen J.A., Ring T.A. Chem. Eng. Sci. 46:(10):1991;2389.
27. F. Paraguay, MSC Thesis, Universidad Nacional de Ingenieria, 1997.
28. Joint Committee on Powder Diffraction Standards, Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA, 1988, card 36-1451.
29. C.S. Barret, T.B. Massalski, Structure of Metals, Chapter 9, Pergamon Press, Oxford, 1980.
30. E.F. Kaelble (Ed.), Handbook of X-rays, Part 2, Chapter 17, McGraw-Hill, New York, 1967.
31. Thornton J.A. Annu. Rev. Mater. Sci. 7:1977;239.
32. Thornton J.A. J. Vac. Sci. Technol. 11:(4):1974;666.
33. Blom F.R., et al. Thin Solid Films. 204:1991;365.
34. Weißenrieder K.-S., Müler J.M. Thin Solid Films. 300:1997;30.
35. O.S. Heavens, Optical Properties of Thin Solid Films, Chapter 4, Dover, New York, 1954, p. 58.
36. Oktik S. Prog. Cryst. Growth Charact. 17:1988;171.
37. Tomar M.S., Garcia F.J. Prog. Cryst. Growth Charact. 4:1981;221.
38. Demiryont H., Nietering K.E. Sol. Energy Mater. 9:1989;79.