Hot electron transport and a quantitative study of ballistic electron magnetic imaging on Co/Cu multilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 17, 2008, Pages

  Kaidatzis, A ^a   Rohart, S ^a   Thiaville, A ^a   Miltat, J ^a  

^a UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 57349101754     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.174426     Document Type: Article

References (42)

1. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 60, 1406 (1988). 10.1103/PhysRevLett.60.1406
2. L. D. Bell and W. J. Kaiser, Phys. Rev. Lett. 61, 2368 (1988). 10.1103/PhysRevLett.61.2368
3. W. H. Rippard and R. A. Buhrman, Appl. Phys. Lett. 75, 1001 (1999). 10.1063/1.124578
4. W. H. Rippard and R. A. Buhrman, Phys. Rev. Lett. 84, 971 (2000). 10.1103/PhysRevLett.84.971
5. M. Prietsch, Phys. Rep. 253, 163 (1995). 10.1016/0370-1573(94)00082-E
6. H. Sirringhaus, E. Y. Lee, and H. von Känel, Phys. Rev. Lett. 74, 3999 (1995). 10.1103/PhysRevLett.74.3999
7. R. Wiesendanger, H.-J. Güntherodt, G. Güntherodt, R. J. Gambino, and R. Ruf, Phys. Rev. Lett. 65, 247 (1990). 10.1103/PhysRevLett.65.247
8. M. Bode, J. Phys.: Condens. Matter 66, 523 (2003).
9. L. D. Bell, Phys. Rev. Lett. 77, 3893 (1996). 10.1103/PhysRevLett.77.3893
10. V. Narayanamurti and M. Kozhevnikov, Phys. Rep. 349, 447 (2001). 10.1016/S0370-1573(00)00119-8
11. V. P. Zhukov, E. V. Chulkov, and P. M. Echenique, Phys. Rev. B 73, 125105 (2006). 10.1103/PhysRevB.73.125105
12. F. J. Garcia-Vidal, P. L. de Andres, and F. Flores, Phys. Rev. Lett. 76, 807 (1996). 10.1103/PhysRevLett.76.807
13. R. Vlutters, O. M. J. van tErve, S. D. Kim, R. Jansen, and J. C. Lodder, Phys. Rev. Lett. 88, 027202 (2001). 10.1103/PhysRevLett.88.027202
14. E. Haq, T. Banerjee, M. H. Siekman, J. C. Lodder, and R. Jansen, Appl. Phys. Lett. 88, 242501 (2006). 10.1063/1.2212066
15. T. Banerjee, J. C. Lodder, and R. Jansen, Phys. Rev. B 76, 140407 (R) (2007). 10.1103/PhysRevB.76.140407
16. D. J. Monsma, J. C. Lodder, T. J. A. Popma, and B. Dieny, Phys. Rev. Lett. 74, 5260 (1995). 10.1103/PhysRevLett.74.5260
17. S. van Dijken, X. Jiang, and S. S. P. Parkin, Appl. Phys. Lett. 83, 951 (2003). 10.1063/1.1592001
18. R. Heer, J. Smoliner, J. Bornemeier, and H. Bruckl, Appl. Phys. Lett. 85, 4388 (2004). 10.1063/1.1814423
19. A. Thiaville, F. Caud, C. Vouille, and J. Miltat, Eur. Phys. J. B 55, 29 (2007). 10.1140/epjb/e2007-00037-3
20. I. Horcas, R. Fernàndez, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007). 10.1063/1.2432410
21. P. Dumas, Y. J. Chabal, and P. Jakob, Surf. Sci. 269-270, 867 (1992). 10.1016/0039-6028(92)91363-G
22. D. R. Penn, S. P. Apell, and S. M. Girvin, Phys. Rev. Lett. 55, 518 (1985). 10.1103/PhysRevLett.55.518
23. D. P. Pappas, K.-P. Kamper, B. P. Miller, H. Hopster, D. E. Fowler, C. R. Brundle, A. C. Luntz, and Z.-X. Shen, Phys. Rev. Lett. 66, 504 (1991). 10.1103/PhysRevLett.66.504
24. J. C. Gröbli, D. Oberli, and F. Meier, Phys. Rev. B 52, R13095 (1995). 10.1103/PhysRevB.52.R13095
25. The error bars in Fig. 3 correspond to the standard deviation of the measurement. However, they mainly indicate the local variations in transmission because of the surface roughness, and to a lesser extent the actual noise of the measurement. Since the films are polycrystalline, electrons that tunnel from the tip to the edges of a grain will be injected into the film at an angle inclined with respect to the normal of the plane of the metal/semiconductor interface. This causes the ballistic electrons to travel a longer path and thus attenuate more until they reach the metal/semiconductor interface. Moreover, their highly off-normal momentum direction causes high reflection at the metal/semiconductor interface, reducing even further the ballistic current measured (Ref.). Spectroscopy curves acquired on polycrystalline films show an overall transmission that scales inversely with the injection angle. Those local variations in the BEEM transmission because of the surface structure are always present, and during imaging give rise to a contrast related to surface topography (Ref.).
26. A. C. Perrella, P. G. Mather, and R. A. Buhrman, J. Appl. Phys. 98, 093713 (2005). 10.1063/1.2128492
27. V. P. Zhukov, E. V. Chulkov, and P. M. Echenique, Phys. Status Solidi A 205, 1296 (2008). 10.1002/pssa.200778141
28. The Cu attenuation length has not yet been determined. However, the lifetime calculation in Ref. and the band structure let us suppose that it is high and similar to that for Au [30-15 nm in the 1-2 eV energy range (Ref.)].
29. E. V. Chulkov, A. G. Borisov, J. P. Gauyacq, D. Sánchez-Portal, V. M. Silkin, V. P. Zhukov, and P. M. Echenique, Chem. Rev. (Washington, D.C.) 106, 4160 (2006). 10.1021/cr050166o
30. V. P. Zhukov, E. V. Chulkov, and P. M. Echenique, Phys. Rev. Lett. 93, 096401 (2004). 10.1103/PhysRevLett.93.096401
31. L. J. Heyderman, H. Niedoba, H. O. Gupta, and I. B. Puchalska, J. Magn. Magn. Mater. 96, 125 (1991). 10.1016/0304-8853(91)90620-P
32. T. Schrefl, J. Fidler, and M. Zehetmayer, J. Appl. Phys. 87, 5517 (2000). 10.1063/1.373390
33. E. Haq, T. Banerjee, M. H. Siekman, J. C. Lodder, and R. Jansen, Appl. Phys. Lett. 86, 082502 (2005). 10.1063/1.1864243
34. A. Hubert and R. Schäfer, Magnetic Domains (Springer, Berlin, 1998).
35. L. J. Heyderman, J. N. Chapman, and S. S. P. Parkin, J. Magn. Magn. Mater. 138, 344 (1994). 10.1016/0304-8853(94)90057-4
36. M. J. Donahue and D. G. Porter,, National Institute of Standards and Technology Interagency Report No. NISTIR 6376, 1999 (unpublished).
37. S. S. P. Parkin, R. Bhadra, and K. P. Roche, Phys. Rev. Lett. 66, 2152 (1991). 10.1103/PhysRevLett.66.2152
38. C. Tivarus, J. P. Pelz, M. K. Hudait, and S. A. Ringel, Appl. Phys. Lett. 87, 182105 (2005). 10.1063/1.2120899
39. The resolution in this case, as measured by the authors, is found to be significantly wider than in other studies (Ref.). However, a different interpretation of the data (for a similar study, see Ref. could attribute the observations to effects not related to BEEM and, thus, to BEEM resolution.
40. A. Bauer, M. T. Cuberes, M. Prietsch, and G. Kaindl, Phys. Rev. Lett. 71, 149 (1993). 10.1103/PhysRevLett.71.149
41. C. A. Ventrice, V. P. LaBella, G. Ramaswamy, H.-P. Yu, and L. J. Schowalter, Phys. Rev. B 53, 3952 (1996). 10.1103/PhysRevB.53.3952
42. D. Rakoczy, G. Strasser, and J. Smoliner, Appl. Phys. Lett. 86, 202112 (2005). 10.1063/1.1924882