Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts

Applied Physics Letters

Volumn 87, Issue 18, 2005, Pages 1-3

  Tivarus, C ^a   Pelz, J P ^a   Hudait, M K ^a   Ringel, S A ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC ELECTRON EMISSION MICROSCOPY; BEEM RESOLUTIONS; MULTIPLE HOT-ELECTRON SCATTERING;

ELECTRON SCATTERING; METALLIC FILMS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR QUANTUM WELLS;

ELECTRON EMISSION;

EID: 27344438415     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2120899     Document Type: Article

References (18)

1. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.60.1406 60, 1406 (1988); W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 61, 2368 (1988).
2. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.60.1406 60, 1406 (1988); W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 61, 2368 (1988).
3. V. Narayanamurti and M. Kozhevnikov, Phys. Rep. 349, 447 (2001).
4. D. L. Smith, E. Y. Lee, and V. Narayanamurti, Phys. Rev. Lett. 80, 2433 (1998).
5. A. A. Talin, R. S. Williams, B. A. Morgan, K. M. Ring, and K. L. Kavanaugh, Phys. Rev. B 49, 16474 (1994).
6. H. Palm, M. Arbes, and M. Schulz, Phys. Rev. Lett. 71, 2224 (1993).
7. A. M. Milliken, S. J. Manion, W. J. Kaiser, L. D. Bell, and M. H. Hecht, Phys. Rev. B 46, 12826 (1992).
8. A. Davies, J. G. Couillard, and H. G. Craighead, Appl. Phys. Lett. 61, 1040 (1992).
9. H. Sirringhaus, E. Y. Lee, and H. von Kanel, Phys. Rev. Lett. 74, 3999 (1995).
10. C. Manke, Y. Bodschwinna, and M. Schulz, Appl. Surf. Sci. 117/118, 321 (1997).
11. L. J. Schowalter and E. Y. Lee, Phys. Rev. B 43, 9308 (1991).
12. M.-L. Ke, R. H. Williams, D. I. Westwood, and B. E. Richardson, Microelectron. Eng. 31, 195 (1996).
13. J. P. Pelz and R. H. Koch, Phys. Rev. B 41, 1212 (1990).
14. C. Tivarus, J. P. Pelz, M. K. Hudait, and S. A. Ringel, Phys. Rev. Lett. 94, 206803 (2005).
15. D. Rakoczy, G. Strasser, and J. Smoliner, Appl. Phys. Lett. 86, 202112 (2005).
16. Y. Ding, K. B. Park, J. P. Pelz, K. C. Palle, M. K. Mikhov, B. J. Skromme, H. Meidia, and S. Mahajan, Phys. Rev. B 69, 041305 (2004).
17. C. Tivarus, J. P. Pelz, M. K. Hudait, and S. A. Ringel, Proceedings of the 2005 International Conference on Characterization and Metrology for ULSI Technology, March 2005 (unpublished).
18. F. J. Garcia-Vidal, P. L. de Andres, and F. Flores, Phys. Rev. Lett. 76, 807 (1996).