Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution

Applied Physics Letters

Volumn 75, Issue 7, 1999, Pages 1001-1003

  Rippard, W H ^a   Buhrman, R A ^a  

^a School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001603253     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124578     Document Type: Article

References (15)

1. Recent reviews are M. A. M. Gijs and G. E. W. Bauer, Adv. Phys. 46, 285 (1997); M. D. Stiles, J. Appl. Phys. 79, 5805 (1996); F. J. Himpsel, J. E. Ortega, G. J. Mankey, and R. F. Willis, Adv. Phys. 4, 511 (1998).
2. Recent reviews are M. A. M. Gijs and G. E. W. Bauer, Adv. Phys. 46, 285 (1997); M. D. Stiles, J. Appl. Phys. 79, 5805 (1996); F. J. Himpsel, J. E. Ortega, G. J. Mankey, and R. F. Willis, Adv. Phys. 4, 511 (1998).
3. Recent reviews are M. A. M. Gijs and G. E. W. Bauer, Adv. Phys. 46, 285 (1997); M. D. Stiles, J. Appl. Phys. 79, 5805 (1996); F. J. Himpsel, J. E. Ortega, G. J. Mankey, and R. F. Willis, Adv. Phys. 4, 511 (1998).
4. Recent reviews are S. S. P. Parkin, Annu. Rev. Mater. Sci. 25, 357 (1995); A. Barthélémy, A. Fert, R. Morel, and L. Steven, , Phys. World 7, 511 (1994).
5. Recent reviews are S. S. P. Parkin, Annu. Rev. Mater. Sci. 25, 357 (1995); A. Barthélémy, A. Fert, R. Morel, and L. Steven, , Phys. World 7, 511 (1994).
6. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 60, 1406 (1988); L. D. Bell, W. J. Kaiser, M. H. Hecht, and L. C. Davis, in Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic, San Diego, CA, 1993), p. 307.
7. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 60, 1406 (1988); L. D. Bell, W. J. Kaiser, M. H. Hecht, and L. C. Davis, in Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic, San Diego, CA, 1993), p. 307.
8. M. Prietsch, Phys. Rep. 253, 163 (1995), and references therein.
9. N. F. Mott, Adv. Phys. 13, 325 (1964).
10. P. J. Grunthaner, F. J. Grunthaner, R. W. Fathauer, T. L. Lin, M. H. Hecht, L. D. Bell, W. J. Kaiser, F. D. Schowengerdt, and J. H. Mazur, , Thin Solid Films 183, 197 (1989).
11. A highly resistive junction minimizes Johnson noise in the system, most easily achieved by having a high barrier-height interface, e.g., Au-Si.
12. S. S. P. Parkin, R. Bhadra, and K. P. Roche, Phys. Rev. Lett. 66, 2152 (1991).
13. M. Dreyer, M. Kleiber, A. Wadas, and R. Wiesendanger, Phys. Rev. B 59, 4273 (1999); J. A. Borchers, J. A. Cura, J. Unguris, D. Tulchinsky, M. H. Kelley, C. F. Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt, Jr., and J. Bass, Phys. Rev. Lett. 82, 2796 (1999).
14. M. Dreyer, M. Kleiber, A. Wadas, and R. Wiesendanger, Phys. Rev. B 59, 4273 (1999); J. A. Borchers, J. A. Cura, J. Unguris, D. Tulchinsky, M. H. Kelley, C. F. Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt, Jr., and J. Bass, Phys. Rev. Lett. 82, 2796 (1999).
15. W. H. Rippard and R. A. Buhrman (unpublished).