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Volumn 77, Issue 18, 1996, Pages 3893-3896
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Evidence of momentum conservation at a nonepitaxial metal/semiconductor interface using ballistic electron emission microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001735483
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.77.3893 Document Type: Article |
Times cited : (89)
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References (20)
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