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Volumn 76, Issue 5, 1996, Pages 807-810
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Elastic scattering and the lateral resolution of ballistic electron emission microscopy: Focusing effects on the Au/Si interface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000176482
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.76.807 Document Type: Article |
Times cited : (68)
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References (24)
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