Measurement of hot-electron scattering processes at Au/Si(100) Schottky interfaces by temperature-dependent ballistic-electron-emission microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 7, 1996, Pages 3952-3959

  Ventrice, C ^a   LaBella, V ^a   Ramaswamy, G ^a   Yu, H P ^a   Schowalter, L ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001290296     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.3952     Document Type: Article

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