Loss of polarization in a hot-electron current through electron-electron scattering

Journal of Applied Physics

Volumn 98, Issue 9, 2005, Pages

  Perrella, A C ^a   Mather, P G ^a   Buhrman, R A ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC ELECTRON EMISSION MICROSCOPY; ELECTRON CURRENTS; HOT ELECTRONS; SPIN-DEPENDENT TRANSPORT;

COBALT; ELECTRON MICROSCOPY; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; OXIDATION; POLARIZATION;

ELECTRON ENERGY LEVELS;

EID: 27844558889     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2128492     Document Type: Article

References (18)

1. S. S. P. Parkin, Annu. Rev. Mater. Sci. 25, 357 (1995).
2. M. Covington, J. Nowak, and D. Song, Appl. Phys. Lett. 76, 3965 (2000).
3. S. Tehrani et al., Proc. IEEE 91, 703 (2003).
4. R. Jansen, J. Phys. D 36, R289 (2003).
5. W. H. Rippard and R. A. Buhrman, Phys. Rev. Lett. 84, 971 (2000).
6. R. Heer, J. Smoliner, J. Bornemeier, and H. Brckl, Appl. Phys. Lett. 85, 4388 (2004).
7. E. Haq, T. Banerjee, M. H. Siekman, J. C. Lodder, and R. Jansen, Appl. Phys. Lett. 86, 082502 (2005).
8. H. Oshima, K. Nagasaka, Y. Seyama, A. Jogo, Y. Shimizu, A. Tanaka, and Y. Miura, IEEE Trans. Magn. 39, 2377 (2003).
9. W. J. Kaiser and L. D. Bell, Phys. Rev. Lett. 60, 1406 (1988).
10. W. H. Rippard and R. A. Buhrman, Appl. Phys. Lett. 75, 1001 (1999).
11. W. H. Rippard, Ph.D. thesis, Cornell University, 2000.
12. A. C. Perrella, Ph.D. thesis, Cornell University, 2004.
13. W. H. Rippard, A. C. Perrella, F. J. Albert, and R. A. Buhrman, Phys. Rev. Lett. 88, 046805 (2002).
14. P. Neidermann, L. Quattropanni, K. Solt, I. Maggio-April, and O. Fischer, Phys. Rev. B 48, 8833 (1993).
15. L. D. Bell, W. J. Kaiser, M. H. Hecht, and L. C. Davis, J. Vac. Sci. Technol. B 92, 594 (1991).
16. L. D. Bell, W. J. Kaiser, M. H. Hecht, and L. C. Davis, Scanning Tunneling Microscopy (Academic, New York, 1993), Chap..
17. G. D. Fuchs et al., Appl. Phys. Lett. 85, 1205 (2004).
18. M. J. Plisch, J. L. Chang, J. Silcox, and R. A. Buhrman, Appl. Phys. Lett. 79, 391 (2001).