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Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

Copper enhanced (111) texture in silver thin films on amorphous SiO 2

(3) Zoo, Yeongseok a Han, H a Alford, T L a

a ARIZONA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; DISORDERED REGIONS; GLANCING ANGLE XRD; POLE FIGURE ANALYSIS; RESISTIVITY MEASUREMENT; SILVER THIN FILMS; TEXTURE ENHANCEMENT; TEXTURE EVOLUTIONS;

ADATOMS; ATOMIC FORCE MICROSCOPY; COPPER; GRAIN GROWTH; RECRYSTALLIZATION (METALLURGY); TEXTURES; THIN FILMS; X RAY DIFFRACTION;

SILVER;

EID: 57049138788 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2800998 Document Type: Article

Times cited : (11)

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