Comparison of texture evolution in Ag and Ag(Ai) alloy thin films on amorphous SiO 2

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 5180-5188

  Kim, H C ^a   Theodore, N D ^a,b   Alford, T L ^a  

^a Arizona State University   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY FILMS; FILM STRUCTURES; TEXTURE EVOLUTION;

AGGLOMERATION; AMORPHOUS MATERIALS; FREE ENERGY; METALLIZING; SILICA; SILVER ALLOYS; SUBSTRATES; TEXTURES; THERMAL EFFECTS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 2442486807     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1682685     Document Type: Article

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