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Volumn 255, Issue 5 PART 2, 2008, Pages 2557-2560

Investigation of local order of a-SiN:H films deposited by hot wire chemical vapour deposition (HWCVD)

Author keywords

a SiN:H; HWCVD; Raman; XPS

Indexed keywords

AMORPHOUS FILMS; AMORPHOUS MATERIALS; AMORPHOUS SILICON; CHEMICAL VAPOR DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NITROGEN; SILICON NITRIDE;

EID: 56949098509     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.151     Document Type: Article
Times cited : (24)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.