XPS analysis of surface layer of sol-gel-derived PZT thin films

Journal of the European Ceramic Society

Volumn 24, Issue 6, 2004, Pages 1157-1160

  Sugiyama, O ^a   Murakami, K ^b   Kaneko, S ^b  

^a Fuji Industrial Research Institute of Shizuoka Prefecture   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

Author keywords

PZT; Sol gel process; Spectroscopy; Surfaces; X ray methods

Indexed keywords

BINDING ENERGY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ENERGY DISPERSIVE SPECTROSCOPY; ESTIMATION; LEAD COMPOUNDS; SOL-GELS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTALLINE PHASES;

THIN FILMS;

CERAMICS; FILM; SOL-GEL PROCESS;

EID: 0942278180     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00590-9     Document Type: Article

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