Compositional homogeneity of ferroelectric (Pb,La)(Ti,Zr)O3 thick films

Journal of Materials Research

Volumn 18, Issue 2, 2003, Pages 515-523

  Bernik, S ^a   Marinenko, R B ^b   Holc, J ^a   Samardzija Z ^a   Ceh M ^a   Kosec, M ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; LEAD COMPOUNDS; PARTIAL PRESSURE; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELEMENT MAPS;

THICK FILMS;

EID: 0037661312     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0065     Document Type: Article

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