Analysis of the phase content and Zr:Ti fluctuation phenomena in PZT sol-gel films with a nominal composition near the morphotropic phase boundary

Journal of the European Ceramic Society

Volumn 24, Issue 6, 2004, Pages 1579-1583

  Dutschke, Anke ^a   Meinhardt, Jürgen ^a   Sporn, Dieter ^a  

^a FRAUNHOFER INSTITUTE FOR SILICATE RESEARCH ISC   (Germany)

Author keywords

Electron microscopy; Films; Grain size; Microstructure final; PZT

Indexed keywords

ANNEALING; CERAMIC MATERIALS; MICROMETERS; MICROSTRUCTURE; PIEZOELECTRIC DEVICES; PYROLYSIS; THERMAL EXPANSION; THIN FILMS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM;

MORPHOTROPHIC PHASE BOUNDARY; PHASE CONTENT;

SOL-GELS;

MICROSTRUCTURE;

EID: 0942280278     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00407-2     Document Type: Article

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