Quantitative chemical analysis of fluorite-to-perovskite transformations in (Pb,La) (Zr,Ti)O3 PLZT thin films

Journal of Materials Research

Volumn 23, Issue 11, 2008, Pages 2944-2953

  Parish, Chad M ^a   Brennecka, Geoff L ^a   Tuttle, Bruce A ^a   Brewer, Luke N ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FLUORSPAR; LANTHANUM; LEAD; LEAD ALLOYS; OXIDE MINERALS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEGREGATION (METALLOGRAPHY); SEMICONDUCTING LEAD COMPOUNDS; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM;

BEFORE AND AFTER; CATION DISTRIBUTIONS; LEAD LOSSES; PLZT THIN FILMS; QUANTITATIVE CHEMICAL ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; THIN-FILMS;

PEROVSKITE;

EID: 56549126787     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2008.0353     Document Type: Article

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