Microstructural development in sol-gel derived lead zirconate titanate thin films: The role of precursor stoichiometry and processing environment

Journal of Materials Research

Volumn 11, Issue 8, 1996, Pages 2076-2084

  Lefevre, M J ^a   Speck, J S ^a   Schwartz, R W ^b   Dimos, D ^b   Lockwood, S J ^b  

^a University of California at Santa Barbara   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; FERROELECTRIC MATERIALS; HEAT TREATMENT; LEAD COMPOUNDS; NUCLEATION; PEROVSKITE; SOL-GELS; STOICHIOMETRY;

LEAD ZIRCONATE TITANATE THIN FILMS; PRECURSOR STOICHIOMETRY; VOLATILIZATION;

THIN FILMS;

EID: 0030216163     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0261     Document Type: Article

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