Optimal scaling of TOF-SIMS spectrum-images prior to multivariate statistical analysis

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 240-244

  Keenan, Michael R ^a   Kotula, Paul G ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Multivariate analysis; PCA; Poisson noise; TOF SIMS imaging

Indexed keywords

DATA REDUCTION; IMAGE ANALYSIS; MATRIX ALGEBRA; PRINCIPAL COMPONENT ANALYSIS; STATISTICAL METHODS;

MASS SPECTRA; MULTIVARIATE ANALYSIS; POISSON NOISE; STANDARD DEVIATION;

SECONDARY ION MASS SPECTROMETRY;

EID: 2942567927     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.025     Document Type: Conference Paper

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