Accurate estimation of SRAM dynamic stability

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 16, Issue 12, 2008, Pages 1639-1647

  Khalil, Diaaeldin ^a   Khellah, Muhammad ^b   Kim, Nam Sung ^b   Ismail, Yehea ^a   Karnik, Tanay ^b   De Vivek, K ^b  

^a Northwestern University   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Circuit stability; Process variations; Random dopant fluctuation (RDF); SRAM; Yield estimation

Indexed keywords

MONTE CARLO METHODS; PROBABILITY; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; STABILITY CRITERIA;

CIRCUIT STABILITY; PROCESS VARIATIONS; RANDOM DOPANT FLUCTUATION (RDF); SRAM; YIELD ESTIMATION;

STATIC RANDOM ACCESS STORAGE;

EID: 56749136206     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2001941     Document Type: Article

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