Plasma-source mass spectrometry for speciation analysis: State-of-the-art

Journal of Chromatography A

Volumn 1050, Issue 1, 2004, Pages 3-34

  Ray, Steven J ^a   Andrade, Francisco ^a   Gamez, Gerardo ^a   McClenathan, Denise ^a   Rogers, Duane ^a   Schilling, Gregory ^a   Wetzel, William ^a   Hieftje, Gary M ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

Electrospray ionization mass spectrometry; Elemental speciation; Time of Flight mass spectrometry; Tunable ionization sources

Indexed keywords

ELEMENTAL SPECIATION ANALYSIS; PLASMA-SOURCE MASS SPECTROMETRY (PS-MS);

IONIZATION; PLASMAS; SPRAYING;

MASS SPECTROMETRY;

CHEMICAL PROCEDURES; ELECTRONICS; ELECTROSPRAY; IONIZATION; LASER SURGERY; MASS SPECTROMETRY; MICROWAVE RADIATION; PRIORITY JOURNAL; REACTION ANALYSIS; REVIEW; SPECIES DIFFERENTIATION; TIME OF FLIGHT MASS SPECTROMETRY;

LASERS; MASS SPECTROMETRY; MICROWAVES; NANOTECHNOLOGY; SPECTROMETRY, MASS, ELECTROSPRAY IONIZATION;

EID: 5644227607     PISSN: 00219673     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chroma.2004.07.107     Document Type: Review

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