메뉴 건너뛰기




Volumn 51, Issue 10, 1997, Pages 1464-1470

Electrospray ionization time-of-flight mass spectrometer for elemental analysis

Author keywords

Electrospray ionization; Elemental analysis; Time of flight mass spectrometry

Indexed keywords

INTERFACES (MATERIALS); IONIZATION; IONS; ISOTOPES; MASS SPECTROMETERS; MOLECULES;

EID: 0031246765     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971939235     Document Type: Article
Times cited : (18)

References (35)
  • 14
    • 0002482452 scopus 로고
    • Fundamental Aspects of Inductively Coupled Plasma-Mass Spectrometry
    • A. Montaser and D. W. Golightly, Eds. VCH, New York
    • D. J. Douglas, "Fundamental Aspects of Inductively Coupled Plasma-Mass Spectrometry", in Inductively Coupled Plasmas in Analytical Atomic Spectrometry, A. Montaser and D. W. Golightly, Eds. (VCH, New York, 1992), pp. 642-646.
    • (1992) Inductively Coupled Plasmas in Analytical Atomic Spectrometry , pp. 642-646
    • Douglas, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.