Highly sensitive beryllium detection with microwave plasma source atomic emission spectrometry

Analytica Chimica Acta

Volumn 422, Issue 2, 2000, Pages 209-216

  Su, Yongxuan ^a   Jin, Zhe ^a   Duan, Yixiang ^a   Koby, Martin ^a   Majidi, Vahid ^a   Olivares, Jose A ^a   Abeln, Stephen P ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Atomic emission spectrometry; Beryllium; Elemental analysis; Microwave plasma

Indexed keywords

ARGON; BERYLLIUM; COPPER; NICKEL;

ANALYTIC METHOD; ARTICLE; ATOMIC EMISSION SPECTROMETRY; CALIBRATION; GAS FLOW; MICROWAVE RADIATION; NEBULIZATION; PRIORITY JOURNAL;

EID: 0034642136     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(00)01067-9     Document Type: Article

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