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1
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0030082199
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Far ultraviolet absolute reflectometer for optical constants determination of ultra high vacuum prepared thin films
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J. A. Aznárez, J. I. Larruquert, J. A. Méndez, "Far ultraviolet absolute reflectometer for optical constants determination of ultra high vacuum prepared thin films", Rev. Sci. Instr. 67, 497-502 (1996).
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(1996)
Rev. Sci. Instr
, vol.67
, pp. 497-502
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Aznárez, J.A.1
Larruquert, J.I.2
Méndez, J.A.3
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2
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30844449955
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Reflecting coatings for the extreme ultraviolet
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G. Hass, R. Tousey, "Reflecting coatings for the extreme ultraviolet", JOSA 49, 593-602 (1959).
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(1959)
JOSA
, vol.49
, pp. 593-602
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Hass, G.1
Tousey, R.2
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3
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30344432690
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Far ultraviolet reflectance variation of MgF2-protected aluminum films under controlled exposure to the main components of the atmosphere
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M. Fernández-Perea, J. A. Aznárez, J. Calvo-Angós, J. I. Larruquert, J. A. Méndez, "Far ultraviolet reflectance variation of MgF2-protected aluminum films under controlled exposure to the main components of the atmosphere", Thin Solid Films 497, 249-253 (2006).
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(2006)
Thin Solid Films
, vol.497
, pp. 249-253
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Fernández-Perea, M.1
Aznárez, J.A.2
Calvo-Angós, J.3
Larruquert, J.I.4
Méndez, J.A.5
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4
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0034315371
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Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process
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E. Quesnel, L. Dumas, D. Jacob, F. Peiró, "Optical and microstructural properties of MgF2 UV coatings grown by ion beam sputtering process", J. Vac. Sci. Technol. A 18, 2869-2876 (2000).
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(2000)
J. Vac. Sci. Technol. A
, vol.18
, pp. 2869-2876
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Quesnel, E.1
Dumas, L.2
Jacob, D.3
Peiró, F.4
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5
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0010262495
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Silicon-carbide diffraction grating for the vacuum ultraviolet: Feasibility
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W. J. Choyke, W. D. Partlow, E. P. Supertzi, F. J. Venskytis, G. B. Brandt, "Silicon-carbide diffraction grating for the vacuum ultraviolet: feasibility," Appl. Opt. 16, 2013-2014 (1977).
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(1977)
Appl. Opt
, vol.16
, pp. 2013-2014
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Choyke, W.J.1
Partlow, W.D.2
Supertzi, E.P.3
Venskytis, F.J.4
Brandt, G.B.5
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6
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0038492650
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Optical properties of hot-pressed B4C in the extreme ultraviolet
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J. I. Larruquert, R. A. M. Keski-Kuha, "Optical properties of hot-pressed B4C in the extreme ultraviolet", Appl. Opt. 39, 1537-1540 (2000).
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(2000)
Appl. Opt
, vol.39
, pp. 1537-1540
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Larruquert, J.I.1
Keski-Kuha, R.A.M.2
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7
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0000090702
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Amorphous silicon carbide coatings for extreme ultraviolet optics
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J. B. Kortright, D. L. Windt, "Amorphous silicon carbide coatings for extreme ultraviolet optics", Appl. Opt. 27, 2841-2846 (1988).
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(1988)
Appl. Opt
, vol.27
, pp. 2841-2846
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Kortright, J.B.1
Windt, D.L.2
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8
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84975556409
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R. A. M. Keski-Kuha, John F. Osantowski, Howard Herzig, Jeffrey S. Gum, Albert R. Toft, Normal incidence reflectance of ion beam deposited SiC films in the EUV, Appl. Opt. 27, 2815-2816 (1988).
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R. A. M. Keski-Kuha, John F. Osantowski, Howard Herzig, Jeffrey S. Gum, Albert R. Toft, "Normal incidence reflectance of ion beam deposited SiC films in the EUV", Appl. Opt. 27, 2815-2816 (1988).
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-
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9
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0028508153
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Ion-beam-deposited boron carbide coatings for extreme ultraviolet
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G. M. Blumenstock, R. A. M. Keski-Kuha, "Ion-beam-deposited boron carbide coatings for extreme ultraviolet", Appl. Opt. 33, 5962-5963 (1994).
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(1994)
Appl. Opt
, vol.33
, pp. 5962-5963
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Blumenstock, G.M.1
Keski-Kuha, R.A.M.2
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10
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0009784093
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Optical properties of evaporated iridium in the vacuum ultraviolet from 500 Å to 2000 Å
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G. Hass, G. F. Jacobus, W. R. Hunter, "Optical properties of evaporated iridium in the vacuum ultraviolet from 500 Å to 2000 Å", J. Opt. Soc. Am. 57, 758-762 (1967).
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(1967)
J. Opt. Soc. Am
, vol.57
, pp. 758-762
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Hass, G.1
Jacobus, G.F.2
Hunter, W.R.3
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11
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0037963517
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Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb and of evaporated Cr
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J. I. Larruquert, R. A. M. Keski-Kuha, "Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb and of evaporated Cr", Appl. Opt. 39, 2772-2781 (2000).
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(2000)
Appl. Opt
, vol.39
, pp. 2772-2781
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Larruquert, J.I.1
Keski-Kuha, R.A.M.2
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12
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0001420720
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Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 121.6 nm
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J. I. Larruquert, R. A. M. Keski-Kuha, "Multilayer coatings with high reflectance in the extreme-ultraviolet spectral range of 50 to 121.6 nm", Appl. Opt. 38, 1231-1236 (1999).
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(1999)
Appl. Opt
, vol.38
, pp. 1231-1236
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Larruquert, J.I.1
Keski-Kuha, R.A.M.2
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13
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29444442597
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Terbium-based extreme ultraviolet multilayers
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. D. L. Windt, J. F. Seely, B. Kjornrattanawanich, Yu. A. Uspenskii, "Terbium-based extreme ultraviolet multilayers", Opt. Lett. 30, 3186-3188, (2005).
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(2005)
Opt. Lett
, vol.30
, pp. 3186-3188
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Windt, D.L.1
Seely, J.F.2
Kjornrattanawanich, B.3
Uspenskii, Y.A.4
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14
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33750595647
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Coated photodiode technique for the determination of the optical constants of reactive elements: La and Tb
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J. F. Seely, Y. A. Uspenski, B. Kjornrattanawanich, D. L. Windt, "Coated photodiode technique for the determination of the optical constants of reactive elements: La and Tb", Proc. SPIE 6317, 63170T-1 (2005).
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(2005)
Proc. SPIE
, vol.6317
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Seely, J.F.1
Uspenski, Y.A.2
Kjornrattanawanich, B.3
Windt, D.L.4
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15
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33845588362
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Determination of optical constants of scandium films in the 20-1000 eV range
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M. Fernández-Perea, J. I. Larruquert, J. A. Aznárez, .J. A. Méndez, L. Poletto, A. Marco Malvezzi, A. Giglia, S. Nannarone, "Determination of optical constants of scandium films in the 20-1000 eV range", J. Opt. Soc. Am. A 23, 2880-2887 (2006).
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(2006)
J. Opt. Soc. Am. A
, vol.23
, pp. 2880-2887
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Fernández-Perea, M.1
Larruquert, J.I.2
Aznárez, J.A.3
Méndez, J.A.4
Poletto, L.5
Marco Malvezzi, A.6
Giglia, A.7
Nannarone, S.8
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16
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30844435069
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Extreme UV optical constants of rare-earth metals free from effects of air contamination
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VI, E. E. Fill, ed, Proc. SPIE
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Yu. Uspenski, J. Seely, N. Popov, I. Artioukov, A. Vinogradov, D. Windt, B. Kjornrattanawanich, "Extreme UV optical constants of rare-earth metals free from effects of air contamination", in Soft X-Ray Lasers and Applications VI, E. E. Fill, ed., Proc. SPIE 5919, 213-220 (2005).
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(2005)
Soft X-Ray Lasers and Applications
, vol.5919
, pp. 213-220
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-
Uspenski, Y.1
Seely, J.2
Popov, N.3
Artioukov, I.4
Vinogradov, A.5
Windt, D.6
Kjornrattanawanich, B.7
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17
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33750603404
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B. Kjornrattanawanich, D. L. Windt, Y. A. Uspenskii, J. F. Seely, Optical constants determination of neodymium and gadolinium in the 3 nm to 100 nm wavelength range, in Advances in X-ray/EUV optics, components, and applications, A. M. Khounsary, C. Morawe, eds., Proc. of SPIE 6317, 63170U (2006).
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B. Kjornrattanawanich, D. L. Windt, Y. A. Uspenskii, J. F. Seely, "Optical constants determination of neodymium and gadolinium in the 3 nm to 100 nm wavelength range", in Advances in X-ray/EUV optics, components, and applications, A. M. Khounsary, C. Morawe, eds., Proc. of SPIE 6317, 63170U (2006).
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18
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40149101874
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Determination of the transmittance and extinction coefficient of Yb films in the 23-1,700-eV range
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M. Fernández-Perea, J. I. Larruquert, J. A. Aznárez, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone "Determination of the transmittance and extinction coefficient of Yb films in the 23-1,700-eV range", J. Opt. Soc. Am. A 24, 3691-3699 (2007).
-
(2007)
J. Opt. Soc. Am. A
, vol.24
, pp. 3691-3699
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-
Fernández-Perea, M.1
Larruquert, J.I.2
Aznárez, J.A.3
Méndez, J.A.4
Poletto, L.5
Garoli, D.6
Malvezzi, A.M.7
Giglia, A.8
Nannarone, S.9
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19
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85032851972
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M. Fernández-Perea, J. I. Larruquert, J. A. Aznárez, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone Determination of the transmittance and extinction coefficient of Ce films in the 6-1,200-eV range, J. Appl. Phys. 103, 073501-1-7 (2008).
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M. Fernández-Perea, J. I. Larruquert, J. A. Aznárez, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone "Determination of the transmittance and extinction coefficient of Ce films in the 6-1,200-eV range", J. Appl. Phys. 103, 073501-1-7 (2008).
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20
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56249098869
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accepted for publication in Journal of Applied Physics
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M. Fernández-Perea, M. Vidal-Dasilva, J. A. Aznárez, J. I. Larruquert, J. A. Méndez, L. Poletto, D. Garoli, A. M. Malvezzi, A. Giglia, S. Nannarone "Determination of the transmittance and extinction coefficient of Pr films in the 4-1,600-eV range", accepted for publication in Journal of Applied Physics.
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Determination of the transmittance and extinction coefficient of Pr films in the 4-1,600-eV range
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-
Fernández-Perea, M.1
Vidal-Dasilva, M.2
Aznárez, J.A.3
Larruquert, J.I.4
Méndez, J.A.5
Poletto, L.6
Garoli, D.7
Malvezzi, A.M.8
Giglia, A.9
Nannarone, S.10
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