Determination of optical constants of scandium films in the 20-1000 eV range

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 23, Issue 11, 2006, Pages 2880-2887

  Fernández Perea, Mónica ^a   Larruquert, Juan I ^a   Aznárez, José A ^a   Méndez, José A ^a   Poletto, Luca ^b   Malvezzi, A Marco ^c   Giglia, Angelo ^b   Nannarone, Stefano ^b  

^a Consejo Superior de Investigaciones Científicas   (Spain)

^b INFM   (Italy)

^c UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; LIGHT EXTINCTION; REFRACTIVE INDEX; SCANDIUM; THIN FILMS; ULTRAHIGH VACUUM;

OPTICAL CONSTANTS; PHOTON ENERGY; SCANDIUM FILMS; SUM-RULE TESTS; TRANSMITTANCE MEASUREMENTS;

LIGHT TRANSMISSION;

EID: 33845588362     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.23.002880     Document Type: Article

References (23)

1. Y. U. Uspenskii, V. E. Levashov, A. V. Vinogradov, A. I. Fedorenko, V. V. Kondratenko, Y. P. Pershin, E. N. Zubarev, and V. Y. Fedotov, "High-reflectivity multilayer mirrors for a vacuum-ultraviolet interval of 35-50 nm," Opt. Lett. 23, 771-773 (1998).
2. F. Eriksson, G. A. Johansson, H. M. Hertz, E. M. Gullikson, U. Kreissig, and J. Birch, "14.5% near-normal incidence reflectance of Cr/Sc x-ray multilayer mirrors for the water window," Opt. Lett. 28, 2494-2496 (2003).
3. J. H. Weaver and C. G. Olson, "Optical examination of the electronic structure of single-crystal hcp scandium," Phys. Rev. B 16, 731-735 (1977).
4. M. Sigrist, C. Chassaing, J. C. François, F. Antonangeli, N. Zema, and M. Piacentini, "Optical properties of scandium thin films," Phys. Rev. B 35, 3760-3764 (1987).
5. B. Brousseau-Lahaye, C. Colliex, J. Frandon, M. Gasgnier, and P. Trebbia, "Determination of the electron excitation spectrum in scandium and yttrium by means of characteristic energy loss measurements," Phys. Status Solidi B 69, 257-266 (1975).
6. Y. A. Uspenskii, S. V. Antonov, V. Yu, and A. V. Vinogradov, "Optical properties of 3D transition metals in the spectral interval of interest for discharge pumped XUV lasers," in Soft X-Ray Lasers and Applications II, J. J. Rocco and L. B. Da Silva, eds., Proc. SPIE 3156, 288-294 (1997).
7. Y. A. Uspenskii, J. F. Seely, N. L. Popov, A. V. Vinogradov, Y. P. Pershin, and V. V. Kondratenko, "Efficient method for the determination of extreme-ultraviolet optical constants in reactive materials: application to scandium and titanium," J. Opt. Soc. Am. A 21, 298-305 (2004).
8. A. L. Aquila, F. Salmassi, E. M. Gullikson, F. Eriksson, and J. Birch, "Measurements of the optical constants of scandium in the 50-1300 eV range," in Optical Constants of Materials for UV to X-Ray Wavelengths, R. Soufli and J. F. Seely, eds., Proc. SPIE 5538, 64-71 (2004).
9. J. I. Larruquert, J. A. Aznárez, J. A. Méndez, A. M. Malvezzi, L. Poletto, and S. Covini, "Optical properties of Sc films in the far and the extreme ultraviolet," Appl. Opt. 43, 3271-3278 (2004).
10. R. Verucchi and S. Nannarone, "Triode electron bombardment evaporation source for ultrahigh vacuum thin film deposition," Rev. Sci. Instrum. 71, 3444-3450 (2000).
11. S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films (Oxford U. Press, 1948).
12. S. Nannarone, F. Borgatti, A. De Luisa, B. P. Doyle, G. C. Gazzadi, A. Giglia, P. Finetti, N. Mahne, L. Pasquali, M. Pedio, G. Selvaggi, G. Naletto, M. G. Pelizzo, and G. Tondello, "The BEAR beamline at ELETTRA," T. Warwick, J. Arthur, H. A. Padmore, and J. Stöhr, eds., in AIP Conference Proceedings (AIP, 2004), Vol. 705, pp. 450-453.
13. L. Pasquali, A. De Luisa, and S. Nannarone, "The UHV experimental chamber for optical measurements (reflectivity and absorption) and angle resolved photoemission of the BEAR Beamline at ELETTRA," T. Warwick, J. Arthur, H. A. Padmore, and J. Stöhr, eds., in AIP Conference Proceedings (AIP, 2004), Vol. 705, pp. 1142-1145.
14. Absolute XUV silicon photodiode (AXUV series) by International Radiation Detectors, Inc.
15. B. L. Henke, E. M. Gullikson, and J. C. Davis, "X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30000 eV, Z=1-92," At. Data Nucl. Data Tables 54, 181-342 (1993).
16. These data have been updated after the preparation of this research by including the measurements of Ref. 8.
17. Henke et al., data of Ref. 15 are available at http/wwwcxro.lbl.gov/ optical_constants/
18. J. H. Weaver, C. Krafka, D. W. Lynch, and E. E. Koch, Physik Daten, 18-2 (Fach-informationszentrum Energie-Physik-Mathematik GmbH, Karlsruhe, Germany, 1981).
19. M. Gasgnier, Ch. Henry la Blanchetais, and P. E. Caro, "Réactivitè des métaux des terres rares yttriques et du scandium en couches minces vis-à-vis de l'atmosphère résiduelle du microscope électronique," Thin Solid Films 31, 283-295 (1976).
20. B. Sae-Lao and R. Soufli, "Measurements of the refractive index of yttrium in the 50-1300 eV energy region," Appl. Opt. 41, 7309-7316 (2002).
21. T. G. Mayerhöfer, "New method of modeling infrared spectra of non-cubic single-phase polycrystalline materials with random orientation," Appl. Spectrose. 56, 1194-1205 (2002).
22. A tabulated form of the data is available on request at the following e-mail address: larruquertιfa.cetef.csic.es.
23. E. Shiles, T. Sasaki, M. Inokuti, and D. Y. Smith, "Self-consistency and sum-rule tests in the Kramers-Kronig analysis of optical data: applications to aluminium," Phys. Rev. B 22, 1612-1628 (1980).