Far ultraviolet reflectance variation of MgF2-protected aluminum films under controlled exposure to the main components of the atmosphere

Thin Solid Films

Volumn 497, Issue 1-2, 2006, Pages 249-253

  Fernandez Perea M ^a   Aznarez J A ^a   Calvo Angos J ^a   Larruquert, J I ^a   Mendez J A ^a  

^a Consejo Superior de Investigaciones Científicas   (Spain)

Author keywords

Aluminum; Evaporation; Fluorides; Optical coatings

Indexed keywords

ALUMINUM; EVAPORATION; FLUORINE COMPOUNDS; MAGNESIUM COMPOUNDS; OPTICAL COATINGS; ULTRAVIOLET RADIATION;

ALUMINUM FILMS; FLUORIDES; ULTRAVIOLET REFLECTANCE;

METALLIC FILMS;

EID: 30344432690     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.10.074     Document Type: Article

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